{"id":155010,"date":"2026-11-10T10:28:42","date_gmt":"2026-11-10T02:28:42","guid":{"rendered":"https:\/\/www.opteeq.com\/en\/?page_id=155010"},"modified":"2026-11-10T10:35:01","modified_gmt":"2026-11-10T02:35:01","slug":"boundary-scan","status":"publish","type":"page","link":"https:\/\/www.opteeq.com\/en\/boundary-scan\/","title":{"rendered":"Boundary Scan"},"content":{"rendered":"<style>.entry-header,.page-header,.post-header,.single-post .entry-header,.post_title_head{display:none!important} #bss-root{scroll-behavior:smooth} :root{ --primary:#0e8f8f; --primary-dark:#0a6d6d; --primary-deep:#07484f; --accent:#14b8ab; --accent-light:#e6f7f5; --ink:#1a2b33; --ink-soft:#51646e; --bg:#f6fbfa; --card:#ffffff; --line:#dceceb; --radius:16px; --shadow:0 6px 24px rgba(10,109,109,.08); } #bss-root, #bss-root *{margin:0;padding:0;box-sizing:border-box} html{scroll-behavior:smooth;overflow-x:hidden} #bss-root{font-family:\"Segoe UI\",\"Helvetica 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b{color:#d9efe9;font-size:15px} #bss-root .qr-row{display:flex;gap:30px;margin-top:36px;flex-wrap:wrap} #bss-root .qr-row figure{text-align:center;margin:0} #bss-root .qr-row img{width:100px;height:100px;background:#fff;padding:7px;border-radius:14px} #bss-root .qr-row figcaption{font-size:13px;color:#bdeae4;margin-top:9px} #bss-root .reveal{transition:opacity .7s ease,transform .7s ease} #bss-root .reveal.pre{opacity:0;transform:translateY(26px)} #bss-root .reveal.in{opacity:1;transform:none} @media (max-width:960px){ #bss-root .hero-grid, #bss-root .contact-grid{grid-template-columns:1fr} #bss-root .hero h1{font-size:38px} #bss-root .cap-grid, #bss-root .feat-grid, #bss-root .prod-grid, #bss-root .soft-grid{grid-template-columns:1fr 1fr} #bss-root .app-grid, #bss-root .value-grid{grid-template-columns:1fr 1fr} #bss-root .ch-parallel{grid-template-columns:1fr 1fr} #bss-root .hw-specs{grid-template-columns:1fr} #bss-root .nav-links{display:none} #bss-root section{padding:64px 0} } @media (max-width:600px){ #bss-root .cap-grid, #bss-root .feat-grid, #bss-root .prod-grid, #bss-root .soft-grid, #bss-root .app-grid, #bss-root .value-grid, #bss-root .ch-parallel, #bss-root .mini-cards, #bss-root .contact-list{grid-template-columns:1fr} #bss-root .sec-title{font-size:28px} #bss-root .hero{padding:70px 0 90px} #bss-root .donut-wrap{flex-direction:column;text-align:center} #bss-root .donut-legend{align-items:center} }#bss-root .hero h1{font-size:46px;line-height:1.2} #bss-root .sec-title{font-size:36px} #bss-root .pb-tag{font-size:13px;line-height:1.5} #bss-root .hero-badge{font-size:13px} #bss-root .cap-desc{min-height:52px} #bss-root .model-chip{white-space:nowrap}<\/style>\n<div id=\"bss-root\">\n<section class=\"hero\" id=\"top\">\n<div class=\"container hero-grid\">\n<div><span class=\"hero-badge\"><span class=\"dot\"><\/span>SG400x Programmer \/ TAP Controller \u00b7 Now Available<\/span><\/p>\n<h1>Boundary Scan \/ ISP<br \/>Integrated Solution<span class=\"en\">JTAG Boundary Scan \u00d7 In-System Programming<\/span><\/h1>\n<p class=\"lead\">Boundary scan testing and professional in-system programming, deeply integrated into one device and one software suite \u2014 covering the full flow of scan, test, analysis and programming. No physical probes are needed to run interconnect tests and fault detection on precision boards.<\/p>\n<div class=\"hero-steps\"><span>Scan<\/span><i>\/<\/i><span>Test<\/span><i>\/<\/i><span>Analyze<\/span><i>\/<\/i><span>Program<\/span><\/div>\n<\/div>\n<div class=\"hero-visual\"><img decoding=\"async\" class=\"hero-product\" src=\"https:\/\/www.opteeq.com\/wp-content\/uploads\/2026\/11\/product-sg400x.png\" alt=\"OPTEEQ SG400x Programmer \/ TAP Controller\"><\/div>\n<\/div>\n<\/section>\n<section class=\"overview\" id=\"overview\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Solution Overview<\/span><\/p>\n<h2 class=\"sec-title\">Solution Overview<\/h2>\n<\/div>\n<p class=\"reveal\">OPTEEQ&#8217;s integrated boundary scan and in-system programming solution deeply combines JTAG boundary scan testing with professional device programming on one hardware and software platform. Device identification, pin monitoring, test generation, scan testing, program programming and result analysis all run as a single integrated flow, automating the full sequence of &#8220;identify \u2014 import \u2014 generate \u2014 scan \u2014 program \u2014 analyze&#8221; and raising test efficiency.<\/p>\n<p class=\"reveal\">No physical probes and no direct contact with PCB solder joints are required to complete interconnect testing and fault detection on precision boards \u2014 ideal for R&amp;D validation and volume production testing of highly integrated devices such as SoC, CPU and DDR.<\/p>\n<div class=\"value-grid\" style=\"margin-top:20px\">\n<div class=\"value-card reveal\">\n<div class=\"ic\">\ud83d\udcb0<\/div>\n<h5>Higher ROI<\/h5>\n<p>One device, multiple uses, lower equipment investment<\/p>\n<\/div>\n<div class=\"value-card reveal\">\n<div class=\"ic\">\ud83d\udce6<\/div>\n<h5>Space Saving<\/h5>\n<p>Compact body, easy production line integration<\/p>\n<\/div>\n<div class=\"value-card reveal\">\n<div class=\"ic\">\ud83d\udee1\ufe0f<\/div>\n<h5>Better Quality<\/h5>\n<p>Pin-level fault detection and localization<\/p>\n<\/div>\n<div class=\"value-card reveal\">\n<div class=\"ic\">\ud83d\udcc8<\/div>\n<h5>Higher Efficiency<\/h5>\n<p>Four parallel channels, fully automated flow<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section class=\"caps\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Core Capabilities<\/span><\/p>\n<h2 class=\"sec-title\">Three Core Capabilities, <em>One Device<\/em><\/h2>\n<p class=\"sec-sub\">Boundary scan, professional programming and unified management running together on one hardware and software platform<\/p>\n<\/div>\n<div class=\"cap-grid\">\n<div class=\"cap-card reveal\">\n<div class=\"cap-num\">01<\/div>\n<h3>Boundary Scan<\/h3>\n<p class=\"cap-desc\">Board-level interconnect testing based on IEEE 1149.x<\/p>\n<ul class=\"cap-list\">\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Daisy-chain auto scan<\/strong><span>Global coverage report<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Device identification<\/strong><span>Automatic BSDL loading<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Pin monitoring<\/strong><span>Real-time status view and control<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Fault localization<\/strong><span>Pin-level defect pinpointing<\/span><\/div>\n<\/li>\n<\/ul>\n<\/div>\n<div class=\"cap-card reveal\">\n<div class=\"cap-num\">02<\/div>\n<h3>Professional Programming<\/h3>\n<p class=\"cap-desc\">High-speed in-system programming for multiple protocols and device types<\/p>\n<ul class=\"cap-list\">\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Four independent channels<\/strong><span>Program 32 target chips simultaneously<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Flexible power<\/strong><span>Flexible power supply to the target board<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Extreme speed<\/strong><span>Fast programming performance<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Safe and stable<\/strong><span>Dual overload and short-circuit protection<\/span><\/div>\n<\/li>\n<\/ul>\n<\/div>\n<div class=\"cap-card reveal\">\n<div class=\"cap-num\">03<\/div>\n<h3>Unified Management<\/h3>\n<p class=\"cap-desc\">Full-process data management, from R&amp;D to mass production<\/p>\n<ul class=\"cap-list\">\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Project management<\/strong><span>Project configuration \/ task management<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Result traceability<\/strong><span>Test data \/ report export<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Secondary development<\/strong><span>Rich dynamic libraries<\/span><\/div>\n<\/li>\n<li><span class=\"chk\">\u2713<\/span>\n<div><strong>Simple and intuitive<\/strong><span>Visual interface<\/span><\/div>\n<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section>\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Key Features<\/span><\/p>\n<h2 class=\"sec-title\">Key Features<\/h2>\n<p class=\"sec-sub\">Full coverage of standard protocols, open interfaces for easy integration<\/p>\n<\/div>\n<div class=\"feat-grid\">\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u2b21<\/div>\n<p><span class=\"tagline\">IEEE 1149.1 \u00b7 1149.6 \u00b7 1149.7<\/span><\/p>\n<h4>Supports IEEE 1149.1, 1149.6 and 1149.7 standards<\/h4>\n<p>Compatible with mainstream JTAG test standards for different application scenarios<\/p>\n<\/div>\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u21c4<\/div>\n<p><span class=\"tagline\">SPI \u00b7 I2C \u00b7 UART<\/span><\/p>\n<h4>Testing through emulated SPI, I2C and UART protocols<\/h4>\n<p>Multiple protocols to meet different device test requirements<\/p>\n<\/div>\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u2039\u203a<\/div>\n<p><span class=\"tagline\">DLL \u00b7 API \u00b7 C \u00b7 LabVIEW<\/span><\/p>\n<h4>DLL and API for secondary development<\/h4>\n<p>C and LabVIEW examples with complete development interfaces for system integration and function extension<\/p>\n<\/div>\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u25a6<\/div>\n<p><span class=\"tagline\">DDR \u00b7 PCIe \u00b7 Ethernet \u00b7 USB<\/span><\/p>\n<h4>Test programs for common high-speed interface devices<\/h4>\n<p>Covers mainstream interfaces to meet complex system-level test needs<\/p>\n<\/div>\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u25ce<\/div>\n<p><span class=\"tagline\">Non-JTAG Extension<\/span><\/p>\n<h4>Scanning of selected non-JTAG devices<\/h4>\n<p>Extends test coverage to more device types<\/p>\n<\/div>\n<div class=\"feat-card reveal\">\n<div class=\"feat-icon\">\u229e<\/div>\n<p><span class=\"tagline\">Auxiliary Test Boards<\/span><\/p>\n<h4>A wide range of auxiliary test boards<\/h4>\n<p>Rich board options for different application scenarios<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section class=\"compose\" id=\"compose\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">System Composition<\/span><\/p>\n<h2 class=\"sec-title\">System Composition<\/h2>\n<p class=\"sec-sub\">The SG400x programmer \/ TAP controller is the core hardware; together with the host software and an optional IO module it forms a complete integrated solution<\/p>\n<\/div>\n<div class=\"compose-visual reveal\"><img decoding=\"async\" src=\"https:\/\/www.opteeq.com\/wp-content\/uploads\/2026\/11\/compose-hw-sw.png\" alt=\"SG400x connected to four target boards via ribbon cables\"><\/div>\n<div class=\"compose-wrap\">\n<div class=\"block reveal\"><span class=\"block-label\">SOFTWARE<\/span><\/p>\n<h3>OPTEEQ Program &amp; Scan Suite<\/h3>\n<p>A unified host software platform. <strong>Boundary scan<\/strong> \u2014 JTAG-based boundary scan testing, netlist and BSDL management, chip pin monitoring, daisy-chain scanning and interconnect test. <strong>Programming<\/strong> \u2014 in-system programming across multiple device types and protocols. Boundary scan and programming run in parallel to support R&amp;D validation, automated test and volume production.<\/p>\n<\/div>\n<div class=\"compose-arrow\">\u2193<\/div>\n<div class=\"block reveal\"><span class=\"block-label\">HARDWARE<\/span><\/p>\n<h3>OPTEEQ SG400x Programmer \/ TAP Controller<\/h3>\n<ul class=\"hw-specs\">\n<li><span class=\"chk\">\u2713<\/span>Independently configurable voltage output (1.6 V \u2013 5.5 V)<\/li>\n<li><span class=\"chk\">\u2713<\/span>TCK frequency up to 50 MHz<\/li>\n<li><span class=\"chk\">\u2713<\/span>Four independent channels, testing or scanning different chips at the same time<\/li>\n<li><span class=\"chk\">\u2713<\/span>JTAG, DAP, SWD, SPI, I2C, BDM, UART and other interfaces<\/li>\n<li><span class=\"chk\">\u2713<\/span>Compact form factor, easy to integrate into production equipment<\/li>\n<\/ul>\n<div class=\"ch-parallel\">\n<div class=\"ch-card\">\n<div class=\"ch-id\">CH1<\/div>\n<p><svg class=\"ch-ic\" viewBox=\"0 0 24 24\" width=\"26\" height=\"26\" aria-hidden=\"true\"><rect x=\"7\" y=\"7\" width=\"10\" height=\"10\" rx=\"1.5\" fill=\"#0e8f8f\"\/><rect x=\"10\" y=\"10\" width=\"4\" height=\"4\" rx=\".5\" fill=\"#fff\"\/><g stroke=\"#0e8f8f\" stroke-width=\"1.6\" stroke-linecap=\"round\"><line x1=\"9\" y1=\"7\" x2=\"9\" y2=\"3.5\"\/><line x1=\"12\" y1=\"7\" x2=\"12\" y2=\"3.5\"\/><line x1=\"15\" y1=\"7\" x2=\"15\" y2=\"3.5\"\/><line x1=\"9\" y1=\"17\" x2=\"9\" y2=\"20.5\"\/><line x1=\"12\" y1=\"17\" x2=\"12\" y2=\"20.5\"\/><line x1=\"15\" y1=\"17\" x2=\"15\" y2=\"20.5\"\/><line x1=\"7\" y1=\"9\" x2=\"3.5\" y2=\"9\"\/><line x1=\"7\" y1=\"12\" x2=\"3.5\" y2=\"12\"\/><line x1=\"7\" y1=\"15\" x2=\"3.5\" y2=\"15\"\/><line x1=\"17\" y1=\"9\" x2=\"20.5\" y2=\"9\"\/><line x1=\"17\" y1=\"12\" x2=\"20.5\" y2=\"12\"\/><line x1=\"17\" y1=\"15\" x2=\"20.5\" y2=\"15\"\/><\/g><\/svg><\/p>\n<div class=\"ch-chip\">Target chip 1<\/div>\n<p><button type=\"button\" class=\"ch-btn t-burn\">Program<\/button><\/div>\n<div class=\"ch-card\">\n<div class=\"ch-id\">CH2<\/div>\n<p><svg class=\"ch-ic\" viewBox=\"0 0 24 24\" width=\"26\" height=\"26\" aria-hidden=\"true\"><rect x=\"7\" y=\"7\" width=\"10\" height=\"10\" rx=\"1.5\" fill=\"#0e8f8f\"\/><rect x=\"10\" y=\"10\" width=\"4\" height=\"4\" rx=\".5\" fill=\"#fff\"\/><g stroke=\"#0e8f8f\" stroke-width=\"1.6\" stroke-linecap=\"round\"><line x1=\"9\" y1=\"7\" x2=\"9\" y2=\"3.5\"\/><line x1=\"12\" y1=\"7\" x2=\"12\" y2=\"3.5\"\/><line x1=\"15\" y1=\"7\" x2=\"15\" y2=\"3.5\"\/><line x1=\"9\" y1=\"17\" x2=\"9\" y2=\"20.5\"\/><line x1=\"12\" y1=\"17\" x2=\"12\" y2=\"20.5\"\/><line x1=\"15\" y1=\"17\" x2=\"15\" y2=\"20.5\"\/><line x1=\"7\" y1=\"9\" x2=\"3.5\" y2=\"9\"\/><line x1=\"7\" y1=\"12\" x2=\"3.5\" y2=\"12\"\/><line x1=\"7\" y1=\"15\" x2=\"3.5\" y2=\"15\"\/><line x1=\"17\" y1=\"9\" x2=\"20.5\" y2=\"9\"\/><line x1=\"17\" y1=\"12\" x2=\"20.5\" y2=\"12\"\/><line x1=\"17\" y1=\"15\" x2=\"20.5\" y2=\"15\"\/><\/g><\/svg><\/p>\n<div class=\"ch-chip\">Target chip 2<\/div>\n<p><button type=\"button\" class=\"ch-btn t-burn\">Program<\/button><\/div>\n<div class=\"ch-card\">\n<div class=\"ch-id\">CH3<\/div>\n<p><svg class=\"ch-ic\" viewBox=\"0 0 24 24\" width=\"26\" height=\"26\" aria-hidden=\"true\"><rect x=\"7\" y=\"7\" width=\"10\" height=\"10\" rx=\"1.5\" fill=\"#0e8f8f\"\/><rect x=\"10\" y=\"10\" width=\"4\" height=\"4\" rx=\".5\" fill=\"#fff\"\/><g stroke=\"#0e8f8f\" stroke-width=\"1.6\" stroke-linecap=\"round\"><line x1=\"9\" y1=\"7\" x2=\"9\" y2=\"3.5\"\/><line x1=\"12\" y1=\"7\" x2=\"12\" y2=\"3.5\"\/><line x1=\"15\" y1=\"7\" x2=\"15\" y2=\"3.5\"\/><line x1=\"9\" y1=\"17\" x2=\"9\" y2=\"20.5\"\/><line x1=\"12\" y1=\"17\" x2=\"12\" y2=\"20.5\"\/><line x1=\"15\" y1=\"17\" x2=\"15\" y2=\"20.5\"\/><line x1=\"7\" y1=\"9\" x2=\"3.5\" y2=\"9\"\/><line x1=\"7\" y1=\"12\" x2=\"3.5\" y2=\"12\"\/><line x1=\"7\" y1=\"15\" x2=\"3.5\" y2=\"15\"\/><line x1=\"17\" y1=\"9\" x2=\"20.5\" y2=\"9\"\/><line x1=\"17\" y1=\"12\" x2=\"20.5\" y2=\"12\"\/><line x1=\"17\" y1=\"15\" x2=\"20.5\" y2=\"15\"\/><\/g><\/svg><\/p>\n<div class=\"ch-chip\">Target chip 3<\/div>\n<p><button type=\"button\" class=\"ch-btn t-scan\">Boundary Scan<\/button><\/div>\n<div class=\"ch-card\">\n<div class=\"ch-id\">CH4<\/div>\n<p><svg class=\"ch-ic\" viewBox=\"0 0 24 24\" width=\"26\" height=\"26\" aria-hidden=\"true\"><rect x=\"7\" y=\"7\" width=\"10\" height=\"10\" rx=\"1.5\" fill=\"#0e8f8f\"\/><rect x=\"10\" y=\"10\" width=\"4\" height=\"4\" rx=\".5\" fill=\"#fff\"\/><g stroke=\"#0e8f8f\" stroke-width=\"1.6\" stroke-linecap=\"round\"><line x1=\"9\" y1=\"7\" x2=\"9\" y2=\"3.5\"\/><line x1=\"12\" y1=\"7\" x2=\"12\" y2=\"3.5\"\/><line x1=\"15\" y1=\"7\" x2=\"15\" y2=\"3.5\"\/><line x1=\"9\" y1=\"17\" x2=\"9\" y2=\"20.5\"\/><line x1=\"12\" y1=\"17\" x2=\"12\" y2=\"20.5\"\/><line x1=\"15\" y1=\"17\" x2=\"15\" y2=\"20.5\"\/><line x1=\"7\" y1=\"9\" x2=\"3.5\" y2=\"9\"\/><line x1=\"7\" y1=\"12\" x2=\"3.5\" y2=\"12\"\/><line x1=\"7\" y1=\"15\" x2=\"3.5\" y2=\"15\"\/><line x1=\"17\" y1=\"9\" x2=\"20.5\" y2=\"9\"\/><line x1=\"17\" y1=\"12\" x2=\"20.5\" y2=\"12\"\/><line x1=\"17\" y1=\"15\" x2=\"20.5\" y2=\"15\"\/><\/g><\/svg><\/p>\n<div class=\"ch-chip\">Target chip 4<\/div>\n<p><button type=\"button\" class=\"ch-btn t-scan\">Boundary Scan<\/button><\/div>\n<\/div>\n<p class=\"ch-hint\">Click a channel button to switch that channel&#8217;s mode (programming \/ boundary scan)<\/p>\n<\/div>\n<div class=\"compose-arrow\">\u2193<\/div>\n<div class=\"block reveal\"><span class=\"block-label\">OPTIONAL<\/span><\/p>\n<div class=\"opt-row\">\n<div>\n<h3>IO Module<\/h3>\n<p>Optional accessories such as the IO module support connectivity testing and extend test capability as needed.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section class=\"soft-bg\" id=\"software\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Software Capabilities<\/span><\/p>\n<h2 class=\"sec-title\">Software Capabilities<\/h2>\n<p class=\"sec-sub\">A visual, automated and traceable testing and programming experience<\/p>\n<\/div>\n<div class=\"soft-grid\">\n<div class=\"soft-card reveal\">\n<h4>Chip pin status view and control<\/h4>\n<p>The analysis module of the boundary scan test suite, with a visual chip chain view and real-time monitoring of chip pin status.<\/p>\n<div class=\"legend\"><span><b style=\"background:#2563eb\"><\/b>0 &#8211; Low<\/span><span><b style=\"background:#ef4444\"><\/b>1 &#8211; High<\/span><span><b style=\"background:#f59e0b\"><\/b>Z &#8211; Oscillating<\/span><span><b style=\"background:#9ca3af\"><\/b>U &#8211; Unknown<\/span><span><b style=\"background:#111827\"><\/b>L &#8211; Linkage<\/span><\/div>\n<div class=\"mockup\">\n<div class=\"mockup-bar\"><i><\/i><i><\/i><i><\/i><\/div>\n<div class=\"mockup-body\" style=\"padding:10px\"><img decoding=\"async\" src=\"https:\/\/www.opteeq.com\/wp-content\/uploads\/2026\/11\/ui-pinview.png\" alt=\"JTAG chip pin status view\" style=\"width:100%;border-radius:6px;display:block\"><\/div>\n<\/div>\n<div class=\"mini-cards\">\n<div class=\"mini-card\"><b>Visual pin status<\/b><span>Graphically displays JTAG chip status; pins can be set to high, low or high-impedance mode<\/span><\/div>\n<div class=\"mini-card\"><b>Waveform import \/ export<\/b><span>Import and export waveform data in CSV format, with real-time waveform view<\/span><\/div>\n<\/div>\n<\/div>\n<div class=\"soft-card reveal\">\n<h4>Automatic daisy-chain scan &amp; coverage report<\/h4>\n<div class=\"pill-row\"><span>One-click chain identification<\/span><span>Accurate coverage calculation<\/span><span>Visual result reports<\/span><\/div>\n<div class=\"cover-bars\">\n<div class=\"cov-item\"><span class=\"nm\">Test coverage<\/span><\/p>\n<div class=\"cov-track\"><i style=\"width:92%\"><\/i><\/div>\n<p><span class=\"pv\">92%<\/span><\/div>\n<div class=\"cov-item\"><span class=\"nm\">Pin coverage<\/span><\/p>\n<div class=\"cov-track\"><i style=\"width:88%\"><\/i><\/div>\n<p><span class=\"pv\">88%<\/span><\/div>\n<div class=\"cov-item\"><span class=\"nm\">Net coverage<\/span><\/p>\n<div class=\"cov-track\"><i style=\"width:95%\"><\/i><\/div>\n<p><span class=\"pv\">95%<\/span><\/div>\n<\/div>\n<div class=\"donut-wrap\"><svg class=\"donut\" viewBox=\"0 0 120 120\" aria-hidden=\"true\"><circle cx=\"60\" cy=\"60\" r=\"44\" fill=\"none\" stroke=\"#eef4f3\" stroke-width=\"20\"\/><circle cx=\"60\" cy=\"60\" r=\"44\" fill=\"none\" stroke=\"#3b82f6\" stroke-width=\"20\" stroke-dasharray=\"82.1 194.4\" transform=\"rotate(-90 60 60)\"\/><circle cx=\"60\" cy=\"60\" r=\"44\" fill=\"none\" stroke=\"#ef5350\" stroke-width=\"20\" stroke-dasharray=\"66.6 209.9\" stroke-dashoffset=\"-82.1\" transform=\"rotate(-90 60 60)\"\/><circle cx=\"60\" cy=\"60\" r=\"44\" fill=\"none\" stroke=\"#f5a623\" stroke-width=\"20\" stroke-dasharray=\"127.7 148.8\" stroke-dashoffset=\"-148.7\" transform=\"rotate(-90 60 60)\"\/><text x=\"60\" y=\"56\" text-anchor=\"middle\" font-size=\"18\" font-weight=\"700\" fill=\"#07484f\">199<\/text><text x=\"60\" y=\"72\" text-anchor=\"middle\" font-size=\"9\" fill=\"#51646e\">Total pins<\/text><\/svg><\/p>\n<div class=\"donut-legend\"><span><span class=\"dt\" style=\"background:#3b82f6\"><\/span>Tested pins<b>59 \u00b7 29.7%<\/b><\/span><span><span class=\"dt\" style=\"background:#f5a623\"><\/span>Power \/ ground pins<b>92 \u00b7 46.2%<\/b><\/span><span><span class=\"dt\" style=\"background:#ef5350\"><\/span>Untested pins<b>48 \u00b7 24.1%<\/b><\/span><\/div>\n<\/div>\n<div class=\"mini-cards\">\n<div class=\"mini-card\"><b>Automatic scan chain detection<\/b><span>Manages JTAG daisy chains, automatically scans and visualizes chip order and node status to locate anomalies quickly<\/span><\/div>\n<div class=\"mini-card\"><b>Visual coverage report<\/b><span>Automatically calculates and visualizes board-level boundary scan coverage and outputs pin-level test reports<\/span><\/div>\n<\/div>\n<\/div>\n<div class=\"soft-card reveal\">\n<h4>Custom test projects<\/h4>\n<div class=\"pill-row\"><span>Connectivity test<\/span><span>DDR connectivity test<\/span><span>SPI \/ I2C functional test<\/span><\/div>\n<p>Test tasks are configured graphically, with built-in basic test, SPI\/I2C test and other test types. Pre-configuration and post-configuration can both be edited so test flows combine flexibly to match the differing requirements of each board.<\/p>\n<\/div>\n<div class=\"soft-card reveal\">\n<h4>Run and monitor test projects<\/h4>\n<p>Test projects are managed and executed centrally, with custom mapping between project channels and physical channels. Test status logs and device status are displayed side by side in real time, result folders are named automatically by timestamp and serial number, and test data is stored by category for easy traceability, statistics and batch analysis.<\/p>\n<\/div>\n<div class=\"soft-card reveal\" style=\"grid-column:1\/-1\">\n<h4>Test result analysis<\/h4>\n<p>Result files are parsed automatically, presenting test items and failed items in a structured view \u2014 no manual data sorting required, which speeds up analysis. <strong>Standard PDF report preview<\/strong> and <strong>Gerber layout result preview<\/strong> locate faults quickly, covering both document archiving and hardware fault localization.<\/p>\n<div class=\"mini-cards\" style=\"margin-top:22px\">\n<div class=\"mini-card\"><img decoding=\"async\" class=\"shot\" src=\"https:\/\/www.opteeq.com\/wp-content\/uploads\/2026\/11\/ui-pdf-preview.png\" alt=\"PDF schematic result preview\"><b>PDF result preview<\/b><span>Annotates test results on schematic PDFs to locate components and nets quickly<\/span><\/div>\n<div class=\"mini-card\"><img decoding=\"async\" class=\"shot\" src=\"https:\/\/www.opteeq.com\/wp-content\/uploads\/2026\/11\/ui-gerber-preview.png\" alt=\"Gerber layout result preview\"><b>Gerber result preview<\/b><span>Shows fault locations directly on the layout, for both archiving and localization<\/span><\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section id=\"products\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Product Family<\/span><\/p>\n<h2 class=\"sec-title\">SG400x Programmer \/ TAP Controller<\/h2>\n<p class=\"sec-sub\">The SG400 series comes in four models: SG400, SG400E, SG400H and SG400-M<\/p>\n<\/div>\n<p class=\"series-intro reveal\">SG400, SG400E and SG400H are designed for general programming scenarios and all support multi-channel in-system programming and boundary scan testing. SG400-M targets large-capacity devices such as eMMC and OSPI Flash.<\/p>\n<div class=\"prod-grid\">\n<div class=\"prod-card reveal\">\n<div class=\"prod-banner pb-1\">\n<div class=\"pb-brand\">OPTEEQ<\/div>\n<div class=\"pb-name\">SG400<\/div>\n<div class=\"pb-tag\">Mass-production in-system programmer \u00b7 The series foundation<\/div>\n<div class=\"pb-feats\"><span>Faster programming<\/span><span>PoE powered<\/span><span>Flexible deployment<\/span><\/div>\n<\/div>\n<div class=\"prod-body\">\n<h4>The series foundation<\/h4>\n<p>The base model of the SG400 series, powered over PoE in line with IEEE 802.3at. Its newly designed programming engine is on average three times faster than the previous S-series, and channel IO\/VCC voltage is programmable from 1.6 V to 5.5 V.<\/p>\n<\/div>\n<\/div>\n<div class=\"prod-card reveal\">\n<div class=\"prod-banner pb-2\">\n<div class=\"pb-brand\">OPTEEQ<\/div>\n<div class=\"pb-name\">SG400E<\/div>\n<div class=\"pb-tag\">Mass-production in-system programmer \u00b7 Flexible choice with independent power<\/div>\n<div class=\"pb-feats\"><span>Independent power<\/span><span>Safety upgrade<\/span><span>Flexible deployment<\/span><\/div>\n<\/div>\n<div class=\"prod-body\">\n<h4>The flexible choice with independent power<\/h4>\n<p>SG400E adds a VCC\/VPP fast-discharge circuit and dual overload protection to the SG400 hardware for greater stability. Powered independently from 12\u201324 V DC, it deploys flexibly without being limited by a PoE switch or power-sourcing equipment.<\/p>\n<\/div>\n<\/div>\n<div class=\"prod-card reveal\">\n<div class=\"prod-banner pb-3\">\n<div class=\"pb-brand\">OPTEEQ<\/div>\n<div class=\"pb-name\">SG400H<\/div>\n<div class=\"pb-tag\">Mass-production in-system programmer \u00b7 Built for automotive electronics<\/div>\n<div class=\"pb-feats\"><span>VSUP power<\/span><span>5\u201313.5 V \u00b7 200 mA<\/span><span>Board-level power<\/span><\/div>\n<\/div>\n<div class=\"prod-body\">\n<h4>Built for automotive electronics<\/h4>\n<p>SG400H keeps every advantage of the SG400 series and adds an adjustable VSUP supply: all four channels deliver 5\u201313.5 V at 200 mA to power the target board directly. It is especially valuable for automotive MCUs, body controllers and motor drives, where programming needs not only IO logic levels but also a higher supply voltage for the board.<\/p>\n<\/div>\n<\/div>\n<div class=\"prod-card reveal\">\n<div class=\"prod-banner pb-4\">\n<div class=\"pb-brand\">OPTEEQ<\/div>\n<div class=\"pb-name\">SG400-M<\/div>\n<div class=\"pb-tag\">Large-capacity in-system programmer \u00b7 For high-density memory<\/div>\n<div class=\"pb-feats\"><span>For large-capacity chips<\/span><span>Dual independent channels<\/span><\/div>\n<\/div>\n<div class=\"prod-body\">\n<h4>For large-capacity chips<\/h4>\n<p>SG400-M programs eMMC, OSPI Flash and NAND devices in-system, with speed optimized for large image files \u2014 suited to head units, center consoles and storage applications that require high-speed programming of large Flash devices.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<section style=\"padding-top:0\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Selection Guide<\/span><\/p>\n<h2 class=\"sec-title\">Selection Guide<\/h2>\n<\/div>\n<div class=\"table-wrap reveal\">\n<table>\n<thead>\n<tr>\n<th>Model<\/th>\n<th>Power<\/th>\n<th>Key features<\/th>\n<th>Applications<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<td><span class=\"model-chip\">SG400<\/span><\/td>\n<td>PoE power<\/td>\n<td>Minimal wiring, powered over the network cable<\/td>\n<td>General MCUs, boards with their own supply<\/td>\n<\/tr>\n<tr>\n<td><span class=\"model-chip\">SG400E<\/span><\/td>\n<td>Independent power<\/td>\n<td>Independent supply, safer and highly noise-immune<\/td>\n<td>Complex production environments<\/td>\n<\/tr>\n<tr>\n<td><span class=\"model-chip\">SG400H<\/span><\/td>\n<td>Independent power<\/td>\n<td>VSUP 5\u201313.5 V board power with voltage and current monitoring<\/td>\n<td>Boards that must be fully powered to program<\/td>\n<\/tr>\n<tr>\n<td><span class=\"model-chip\">SG400-M<\/span><\/td>\n<td>PoE power<\/td>\n<td>Optimized for eMMC and OSPI Flash<\/td>\n<td>Head units, gateways and other high-capacity storage programming<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n<\/div>\n<\/section>\n<section class=\"apps\" id=\"apps\">\n<div class=\"container\">\n<div class=\"sec-head reveal\"><span class=\"sec-eyebrow\">Applications<\/span><\/p>\n<h2 class=\"sec-title\">Applications<\/h2>\n<p class=\"sec-sub\">From consumer electronics to aerospace \u2014 test and programming needs across industries<\/p>\n<\/div>\n<div class=\"app-grid\">\n<div class=\"app-card reveal\">\n<div class=\"ic\">\ud83d\ude97<\/div>\n<h5>Automotive Electronics<\/h5>\n<\/div>\n<div class=\"app-card reveal\">\n<div class=\"ic\">\ud83d\udcbb<\/div>\n<h5>Consumer Electronics<\/h5>\n<\/div>\n<div class=\"app-card reveal\">\n<div class=\"ic\">\ud83c\udfed<\/div>\n<h5>Industrial Electronics<\/h5>\n<\/div>\n<div class=\"app-card reveal\">\n<div class=\"ic\">\u2708\ufe0f<\/div>\n<h5>Aerospace<\/h5>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div>\n<p><script>try{ var bssIO=new IntersectionObserver(function(es){es.forEach(function(e){if(e.isIntersecting){e.target.classList.add('in');bssIO.unobserve(e.target);}});},{threshold:.12}); document.querySelectorAll('#bss-root .reveal').forEach(function(el){ if(el.getBoundingClientRect().top > window.innerHeight){el.classList.add('pre');} bssIO.observe(el); }); }catch(e){} setTimeout(function(){document.querySelectorAll('#bss-root .reveal:not(.in)').forEach(function(el){el.classList.remove('pre');el.classList.add('in');});},1200); document.querySelectorAll('#bss-root .ch-btn').forEach(function(btn){ btn.addEventListener('click',function(){ var burning=btn.classList.toggle('t-burn'); btn.classList.toggle('t-scan',!burning); btn.textContent=burning?'Program':'Boundary Scan'; }); });<\/script><\/p>\n","protected":false},"excerpt":{"rendered":"<p>SG400x Programmer \/ TAP Controller \u00b7 Now Available Boundary Scan \/ ISPIntegrated SolutionJTAG Boundary Scan \u00d7 In-System Programming Boundary scan testing and professional in-system programming, deeply integrated into one device and one software suite \u2014 covering the full flow of scan, test, analysis and programming. No physical probes are needed to run interconnect tests and [&hellip;]<\/p>\n","protected":false},"author":64,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"themepark_post_bcolor":"#f5f5f5","themepark_post_width":"100% dong","themepark_post_img":"","themepark_post_img_po":"left","themepark_post_img_re":false,"themepark_post_img_cover":false,"themepark_post_img_fixed":false,"themepark_post_hide_title":true,"themepark_post_main_b":"","themepark_post_main_p":100,"themepark_paddingblock":false,"footnotes":""},"class_list":["post-155010","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/pages\/155010","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/users\/64"}],"replies":[{"embeddable":true,"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/comments?post=155010"}],"version-history":[{"count":3,"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/pages\/155010\/revisions"}],"predecessor-version":[{"id":155013,"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/pages\/155010\/revisions\/155013"}],"wp:attachment":[{"href":"https:\/\/www.opteeq.com\/en\/wp-json\/wp\/v2\/media?parent=155010"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}